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]. Cosmet. Sci., 59, 225-232 (May/June 2008) AFM capabilities in characterization of particles and surfaces: From angstroms to microns N. STAROSTINA, M. BRODSKY, S. PRIKHODKO, C. M. HOO, M. L. MECARTNEY, and P. WEST, Pacific Nanotechnology Inc., 17981 Sky Park Circle, Irvine, CA 92614 (N.S, P. W.), University of California Los Angeles, UCLA Center for East-West Medicine, Los Angeles, CA 90095-1736 (M.B.), University of California Los Angeles, Department of Materials Science and Engineering, Los Angeles, CA 90095-1595 (S.P.), and University of California Irvine, Chemical Engineering and Material Science, Irvine, CA 92627-2575 (C.M.H., M.L.M.). Accepted for publication January 8, 2008. Presented at the Annual Scientific Meeting and Technology Showcase of the Society of Cosmetic Chemists, New York, December 7-8, 2006. Synopsis Scanning probe microscopy (SPM), invented 25 years ago, is now routinely employed as a surface charac­ terization technique. Atomic force microscopy (AFM) is the most widely used form of SPM, since AFM can be used in ambient conditions with minimal sample preparation. Examples of applications relevant to cosmetics include, but are not limited to, hair and skin roughness measurements and powder particle and nano-emulsion characterization. AFM is well suited for individual particle characterization, especially for measurements of volume, height, size, shape, aspect ratio, and particle surface morphology. Statistical distributions for a large set of particles can be generated through single-particle analysis techniques (i.e., ensemble-like information). AFM is better capable of resolving complex particle-size distributions than dynamic light-scattering (DLS). Single-particle analysis techniques with AFM can be more cost- and time-effective than analyses using scanning electron microscopy (SEM). However, AFM offers resolution that is comparable to or greater than SEM or transmission electron microscopy (TEM) and routinely allows direct measurements of the particle height and volume and produces images easily displayed in a quantified 3D format. INTRODUCTION AFM has been successfully employed for surface topography characterization over the last two decades. IBM researchers developed scanning tunneling microscopy (STM), which is considered an antecedent to AFM, in 1982 (1,2). AFM was invented in 1986 Address all correspondence to N. Starostina at Emerson Process Management, Rosemount Analytical Inc., Liquids, 2400 Barranca Parkway, Irvine, CA 92606. 225
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